Abstract：窗体底端窗体底端
We study random walks in random environments generated by the two-dimensional Gaussian free field. More specifically, we consider a rescaled lattice with a small mesh size and view it as a random network where each edge is equipped with an electric resistance given by a regularization for the exponentiation of the Gaussian free field. We prove the tightness of random walks on such random networks at high temperature as the mesh size tends to 0. Our proof is based on a careful analysis of the (random) effective resistances as well as their connections to random walks.
